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Extreme Environment Electronics
Original price was: ₹23,694.00.₹18,955.20Current price is: ₹18,955.20.
ISBN: 9781439874301
Author/Editor: John D. Cressler
Publisher: CRC Press
Year: 2013
1 in stock (can be backordered)
Description
Unfriendly to conventional electronic devices, circuits, and systems, extreme environments represent a serious challenge to designers and mission architects. The first truly comprehensive guide to this specialized field, Extreme Environment Electronics explains the essential aspects of designing and using devices, circuits, and electronic systems intended to operate in extreme environments, including across wide temperature ranges and in radiation-intense scenarios such as space.
The Definitive Guide to Extreme Environment Electronics
Featuring contributions by some of the world? foremost experts in extreme environment electronics, the book provides in-depth information on a wide array of topics. It begins by describing the extreme conditions and then delves into a description of suitable semiconductor technologies and the modeling of devices within those technologies. It also discusses reliability issues and failure mechanisms that readers need to be aware of, as well as best practices for the design of these electronics.
Continuing beyond just the “paper design” of building blocks, the book rounds out coverage of the design realization process with verification techniques and chapters on electronic packaging for extreme environments. The final set of chapters describes actual chip-level designs for applications in energy and space exploration. Requiring only a basic background in electronics, the book combines theoretical and practical aspects in each self-contained chapter. Appendices supply additional background material.
With its broad coverage and depth, and the expertise of the contributing authors, this is an invaluable reference for engineers, scientists, and technical managers, as well as researchers and graduate students. A hands-on resource, it explores what is required to successfully operate electronics in the most demanding conditions.
Additional information
Weight | 2.54 kg |
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Product Properties
Year of Publication | 2013 |
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Table of Contents | Part I Introduction Big Picture and Some History of the Field John D. Cressler Extreme Environments in NASA Planetary Exploration Elizabeth Kolawa, Mohammad Mojarradi, and Linda Del Castillo Extreme Environment Electronics in NASA's Heliophysics Vision Dana Brewer and Janet Barth Overview of the NASA ETDP RHESE Program Andrew S. Keys Role of Extreme Environment Electronics in NASA's Aeronautics Research Gary W. Hunter and Dennis Culley Technology Options for Extreme Environment Electronics Jonathan A. Pellish and Lewis M. Cohn Part II Background Introduction John D. Cressler Physics of Temperature and Temperature's Role in Carrier Transport John D. Cressler and Kurt A. Moen Overview of Radiation Transport Physics and Component Effects Robert Reed and Janet Barth Interaction of Radiation with Semiconductor Devices Ken F. Galloway and Ron D. Schrimpf Part III Environments and Prediction Tools Introduction John D. Cressler Orbital Radiation Environments Michael Xapsos CREME96 and Related Error Rate Prediction Methods James H. Adams, Jr. Monte Carlo Simulation of Radiation Effects Robert A. Weller Extreme Environments in Energy Production and Utilization Alexander B. Lostetter Extreme Environments in Transportation Peter Wilson and H. Alan Mantooth Part IV Semiconductor Device Technologies for Extreme Environments Introduction John D. Cressler Radiation Effects in Si CMOS Platforms Lloyd W. Massengill Wide Temperature Range Operation of Si CMOS Platforms Aravind C. Appaswamy Trade-Offs between Performance and Reliability in Sub-100 nm RF-CMOS on SOI Technologies Rajan Arora SiGe HBT Platforms John D. Cressler Using Temperature to Explore the Scaling Limits of SiGe HBTs Jiahui Yuan SiC Integrated Circuit Platforms for High-Temperature Applications Philip G. Neudeck Passive Elements in Silicon Technology Edward P. Wilcox Power Device Platforms H. Alan Mantooth CMOS-Compatible Silicon-on-Insulator MESFETs for Extreme Environments Trevor J. Thornton, William Lepkowski, Seth J. Wilk, Mohammad Reza Ghajar, Asha Balijepalli, and Joseph Ervin III-Nitride Platforms Shyh-Chiang Shen Photonic Devices Cheryl J. Marshall Radiation Hardening by Process Michael L. Alles Rad-Hard Silicon Technologies at BAE Systems Richard W. Berger Rad-Hard Silicon Technologies at Honeywell Paul S. Fechner and Jerry Yue High-Temperature SOI Technologies at Honeywell Bruce Ohme Part V Modeling for Extreme Environment Electronic Design Introduction H. Alan Mantooth TCAD of Advanced Transistors Guofu Niu Mixed-Mode TCAD Tools Ashok Raman and Marek Turowski Mixed-Mode TCAD for Modeling of Single-Event Effects Kurt A. Moen and Stanley D. Phillips Compact Modeling of SiGe HBTs Guofu Niu and Lan Luo Compact Modeling of CMOS Devices for Extreme Environments A. Matt Francis Compact Modeling of LDMOS Transistors Avinash S. Kashyap Compact Modeling of Power Devices Ty R. McNutt Best Practices for Modeling Radiation Effects in Mixed Signal Circuits Jeffrey S. Kauppila Compact Model Toolkits Jim Holmes and A. Matt Francis Part VI Device and Circuit Reliability in Extreme Environments Introduction John D. Cressler Failure Mechanisms in Modern Integrated Circuits and Industry Best Practices for Reliability Degradation Predictions Fernando Guarin Considerations for the Reliability Estimation of SiGe HBTs Fernando Guarin Considerations for the Reliability Estimation of Silicon CMOS Stewart Rauch Qualification Methodology for Extreme Environment Electronics Yuan Chen Part VII Circuit Design for Extreme Environments Introduction H. Alan Mantooth Best Practices in Radiation Hardening by Design Jeffrey D. Black Investigations of RHBD Techniques for SiGe Devices and Circuits Stanley D. Phillips Best Practices in Wide Temperature Range Circuit Design Benjamin J. Blalock Achieving Invariability in Analog Circuits Operating in Extreme Environments Peter Wilson, Robert Rudolf, and Reuben Wilcock Part VIII Examples of Extreme Environment Circuit Designs Introduction H. Alan Mantooth Voltage and Current References Laleh Najafizadeh Operational Amplifiers Benjamin J. Blalock Cryogenic Low-Noise Amplifiers Joseph C. Bardin Active Filters Fa Foster Dai and Desheng Ma Analog-to-Digital Converters Benjamin J. Blalock Digital-to-Analog Converters Fa Foster Dai, Yuan Yao, and Zhenqi Chen CMOS Phase-Locked Loops T. Daniel Loveless Low-Voltage, Weakly Saturated SiGe HBT Circuits Sachin Seth Memory Circuits Richard W. Berger Field Programmable Gate Arrays Melanie Berg Microprocessors and Microcontrollers Ken Li and Michael Johnson Asynchronous Digital Circuits Jia Di and Scott C. Smith Characterizing SETs in Oscillator Circuits Stephen J. Horst Low-Voltage Power Electronics Mohammad Mojarradi and Philippe Adell Medium-Voltage Power Electronics Marcelo Schupbach SiC JFET Integrated Circuits for Extreme Environment Electronics Philip G. Neudeck, Michael J. Krasowski, and N. F. Prokop Using CMOS-Compatible SOI MESFETs for Power Supply Management William Lepkowski, Seth J. Wilk, Mohammad Reza Ghajar, Michael Goryll, Keith Hobert, Bertan Bakkaloglu, and Trevor J. Thornton Part IX Verification of Analog and Mixed-Signal Systems Introduction H. Alan Mantooth Model-Based Verification Jim Holmes Event-Driven Mixed-Signal Modeling Techniques for System-in-Package Functional Verification Chip Webber Part X Packaging for Extreme Environments Introduction John D. Cressler Electronic Packaging Approaches for Low-Temperature Environments R. Wayne Johnson Electronic Packaging Approaches for High-Temperature Environments R. Wayne Johnson Failure Analysis of Electronic Packaging Linda Del Castillo Silicon Carbide Power Electronics Packaging Jared Hornberger, Brice McPherson, and Brandon Passmore Part XI Real-World Extreme Environment Applications Introduction H. Alan Mantooth A SiGe Remote Sensor Interface Ryan M. Diestelhorst A SiGe Remote Electronics Unit Troy D. England Distributed Motor Controller for Operation in Extreme Environments Colin McKinney Radiation-Hard Multichannel Digitizer ASIC for Operation in the Jovian Environment Shahid Aslam, Akin Akturk, and Gerard Quilligan Approaches to Commercial Communications Satellite Design David A. Sunderland UHF Micro-Transceiver Development Project William Bill Kuhn and Yogesh Tugnawat Down-Hole Instrumentation Package for Energy Well Drilling Randy Normann Electronics Requirements for Collider Physics Experiments Alexander A. Grillo Cryogenic Electronics for High-Energy Physics Experiments Veljko Radeka, Gianluigi de Geronimo, and Shaorui Li Radar Systems for Extreme Environments Tushar Thrivikraman Part XII Appendices Appendix A: Properties of Silicon and Germanium John D. Cressler Appendix B: Temperature and Energy Scales John D. Cressler Appendix C: Planetary Temperature Ranges and Radiation Levels H. Alan Mantooth Appendix D: Ionizing Radiation Test Facilities Paul W. Marshall Appendix E: Radiation Testing Protocols and Mil-Spec Standards Ronald Pease Appendix F: Primer on the Semiconductor Transport Equations and Their Solution Guofu Niu Appendix G: Primer on MOSFETs H. Alan Mantooth Appendix H: Primer on Si and SiGe Bipolar Transistors John D. Cressler Appendix I: Compendium of NASA's COTS Radiation Test Data Martha O'Bryan Appendix J: Compendium of NASA's COTS Cryogenic Test Data Richard L. Patterson and Ahmad Hammoud |
Author | John D. Cressler |
ISBN/ISSN | 9781439874301 |
Binding | Hardback |
Edition | 1 |
Publisher | CRC Press |
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